US 11,892,489 B2
Sensor with variation in impedance or inductance following a variation of a measurand
Evangéline Benevent, Marseilles (FR)
Assigned to UNIVERSITE D'AIX-MARSEILLE, Marseilles (FR); CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris (FR); and UNIVERSITE DE TOULON, La Garde (FR)
Appl. No. 17/765,426
Filed by UNIVERSITE D'AIX-MARSEILLE, Marseilles (FR); CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris (FR); and UNIVERSITE DE TOULON, La Garde (FR)
PCT Filed Oct. 14, 2020, PCT No. PCT/EP2020/078850
§ 371(c)(1), (2) Date Mar. 30, 2022,
PCT Pub. No. WO2021/074193, PCT Pub. Date Apr. 22, 2021.
Claims priority of application No. 1911713 (FR), filed on Oct. 18, 2019.
Prior Publication US 2022/0357381 A1, Nov. 10, 2022
Int. Cl. G01R 27/28 (2006.01); G01R 27/26 (2006.01)
CPC G01R 27/2611 (2013.01) 14 Claims
OG exemplary drawing
 
1. A device for determining a measurand, comprising:
a first pattern made of a first conductive material, the first pattern having a first impedance and having a first end and a second end at a distance from the first end,
a second pattern at least arranged between the first end and the second end of the first pattern and circumscribing the first pattern, the second pattern being in electrical contact with the first pattern, being made of a second material and having a second impedance that changes continuously as a function of the measurand, such that the impedance or inductance of the assembly formed by the first pattern and the second pattern changes continuously as a function of the measurand,
a means for determining the impedance or the inductance of the assembly formed by the first pattern and the second pattern.