US 11,892,472 B2
Test device
Chang-hyun Song, Busan (KR); and Jae-hwan Jeong, Busan (KR)
Assigned to LEENO INDUSTRIAL INC., Busan (KR)
Appl. No. 17/437,677
Filed by LEENO INDUSTRIAL INC., Busan (KR)
PCT Filed Apr. 17, 2020, PCT No. PCT/KR2020/005149
§ 371(c)(1), (2) Date Sep. 9, 2021,
PCT Pub. No. WO2020/218779, PCT Pub. Date Oct. 29, 2020.
Claims priority of application No. 10-2019-0046788 (KR), filed on Apr. 22, 2019.
Prior Publication US 2022/0155341 A1, May 19, 2022
Int. Cl. G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01); H01L 21/66 (2006.01); H01L 23/58 (2006.01); H01L 29/10 (2006.01)
CPC G01R 1/045 (2013.01) [G01R 1/073 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A test device for testing an electric characteristic of an object to be tested, the test device comprising:
a block comprising a probe hole;
a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point; and
a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe, wherein
an axis of the probe is spaced apart from an axis of the main core of the coaxial cable, and
the probe contact portion is extended radially from the axis of the main core toward the axis of the probe.