US 11,870,504 B2
Translation device, test system including the same, and memory system including the translation device
Hyungmin Jin, Seoul (KR); Younghoon Son, Yongin-si (KR); Hyunyoon Cho, Uiwang-si (KR); Youngdon Choi, Seoul (KR); and Junghwan Choi, Busan (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Jan. 13, 2023, as Appl. No. 18/096,657.
Application 18/096,657 is a continuation of application No. 17/366,329, filed on Jul. 2, 2021, granted, now 11,581,960.
Claims priority of application No. 10-2020-0175831 (KR), filed on Dec. 15, 2020.
Prior Publication US 2023/0171007 A1, Jun. 1, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. H04B 17/19 (2015.01); H04B 17/18 (2015.01); H04B 17/00 (2015.01); H04L 7/00 (2006.01)
CPC H04B 17/19 (2015.01) [H04B 17/0085 (2013.01); H04B 17/18 (2015.01); H04L 7/0016 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A test system comprising:
an automatic test equipment (ATE) including a first pin and a second pin;
a device under test (DUT) including a third pin; and
a built out test (BOT) module configured to be connected to the ATE and the DUT, wherein the BOT module comprises:
a plurality of first input/output (I/O) circuits connected to the first pin and the second pin, respectively, and configured to transmit and receive first signals based on a pulse amplitude modulation (PAM)-M mode;
a second I/O circuit connected to the third pin and configured to transmit and receive a second signal based on a PAM-N mode; and
a translation circuit configured to translate the first signals into the second signal and configured to translate the second signal into the first signals, and
M and N are different integers of 2 or more,
wherein the first signals are received by the first pin and the second pin, translated into the second signal by the translation circuit, and transmitted through the third pin, and
the second signal is received by the third pin, translated into the first signals by the translation circuit, and transmitted through the first pin and the second pin.