US 11,870,246 B2
Overshoot current detection and correction circuit for electrical fast transient events
Shishir Goyal, Bengaluru (IN); and Lokesh Kumar Gupta, Benagluru (IN)
Assigned to TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on May 14, 2019, as Appl. No. 16/411,251.
Claims priority of provisional application 62/820,322, filed on Mar. 19, 2019.
Prior Publication US 2020/0303920 A1, Sep. 24, 2020
Int. Cl. H02H 9/04 (2006.01); G01R 19/10 (2006.01); H02H 1/00 (2006.01); G01R 19/165 (2006.01); H03K 17/082 (2006.01)
CPC H02H 9/045 (2013.01) [G01R 19/10 (2013.01); G01R 19/16571 (2013.01); H02H 1/0007 (2013.01); H03K 17/0822 (2013.01); H03K 17/0826 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A clamping and detection circuit, comprising:
a clamping sub-circuit, comprising:
a first clamping transistor coupled to a bus node and a first node,
a first diode coupled to the bus node and the first node,
a first high pass filter coupled to the bus node and a control input of the first clamping transistor,
a second clamping transistor coupled to the first node and a common mode node,
a second diode coupled to the first node and the common mode node, and
a second high pass filter coupled to the common mode node and a control input of the second clamping transistor;
a positive overshoot current detection sub-circuit, comprising:
a first transistor coupled to the first node,
a current mirror coupled to the first transistor,
a reference current source coupled to the current mirror at a second node, and
a first comparison device coupled to the second node; and
a negative overshoot current detection sub-circuit, comprising:
a biasing sub-circuit coupled to the first node,
a second transistor coupled to the biasing sub-circuit,
a resistor coupled to a supply voltage node and the second transistor at a third node, and
a second comparison device coupled to the third node.