CPC G11C 29/42 (2013.01) [G11C 29/18 (2013.01); G11C 29/4401 (2013.01); H03K 19/21 (2013.01); G11C 2029/4402 (2013.01)] | 19 Claims |
1. A method, comprising:
performing, by a built-in self-test (BIST) unit of a memory device, a memory test on one or more memory banks of the memory device using a first algorithm;
generating, by the BIST unit, miscompare results responsive to performing the memory test on the one or more memory banks of the memory device;
determining, by the BIST unit, failure diagnostic information based on the miscompare results;
generating, by the BIST unit, an error packet comprising the failure diagnostic information and the miscompare results;
determining, by the BIST unit, that the first algorithm was used to perform the memory test associated with the error packet;
tagging, by the BIST unit, the error packet with an identifier to the first algorithm to generate a tagged error packet; and
placing, by the BIST unit, the tagged error packet in a queue of a plurality of error packets to generate a queued error packet.
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