US 11,869,611 B2
Adjustment to trim settings based on a use of a memory device
Ezra E. Hartz, Meridian, ID (US); Joseph A. De La Cerda, Boise, ID (US); Benjamin Rivera, Boise, ID (US); Bruce J. Ford, Meridian, ID (US); Nicolas Soberanes, Boise, ID (US); and Christopher Moore, Redwood City, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Dec. 2, 2022, as Appl. No. 18/074,228.
Application 18/074,228 is a division of application No. 17/307,798, filed on May 4, 2021, granted, now 11,521,694.
Prior Publication US 2023/0095397 A1, Mar. 30, 2023
Int. Cl. G11C 7/04 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/44 (2006.01)
CPC G11C 29/028 (2013.01) [G11C 7/04 (2013.01); G11C 29/12015 (2013.01); G11C 29/44 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
an array of memory cells; and
control circuitry coupled to the array of memory cells and configured to:
receive signaling indicative of an operating temperature of the array of memory cells;
determine whether the operating temperature is greater than a first threshold operating temperature;
determine whether the operating temperature is less than a second threshold operating temperature; and
responsive to determining that the operating temperature is greater than the first threshold operating temperature or less than the second threshold operating temperature, adjust a trim setting of the array of memory cells to improve performance of the array of memory cells.