US 11,868,540 B2
Determination of resonant frequency and quality factor for a sensor system
Ryan Hellman, Austin, TX (US)
Assigned to Cirrus Logic Inc., Austin, TX (US)
Filed by Cirrus Logic International Semiconductor Ltd., Edinburgh (GB)
Filed on Nov. 12, 2020, as Appl. No. 17/096,598.
Claims priority of provisional application 63/086,721, filed on Oct. 2, 2020.
Claims priority of provisional application 63/044,065, filed on Jun. 25, 2020.
Prior Publication US 2021/0405764 A1, Dec. 30, 2021
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 3/02 (2006.01); G01L 1/14 (2006.01); G01L 1/00 (2006.01); G01L 1/18 (2006.01); G01L 1/16 (2006.01)
CPC G06F 3/0202 (2013.01) [G01L 1/005 (2013.01); G01L 1/14 (2013.01); G01L 1/162 (2013.01); G01L 1/183 (2013.01)] 36 Claims
OG exemplary drawing
 
1. A method for determining sensor parameters of an actively-driven sensor system, comprising:
obtaining as few as three samples of a measured physical quantity versus frequency for the actively-driven sensor system;
performing a refinement operation to provide a refined version of the sensor parameters based on the as few as three samples and based on a linear model of an asymmetry between slopes of the measured physical quantity versus frequency between pairs of the as few as three samples;
iteratively repeating the refinement operation until the difference between successive refined versions of the sensor parameters is below a defined threshold; and
outputting the refined sensor parameters as updated sensor parameters for the actively-driven sensor system.