US 11,868,201 B2
Memory evaluation method and apparatus
Zheng Ye, Shenzhen (CN); and Fei Zhang, Shenzhen (CN)
Assigned to HUAWEI TECHNOLOGIES CO., LTD., Shenzhen (CN)
Filed by Huawei Technologies Co., Ltd., Shenzhen (CN)
Filed on May 11, 2022, as Appl. No. 17/741,765.
Application 17/741,765 is a continuation of application No. 16/816,597, filed on Mar. 12, 2020.
Application 16/816,597 is a continuation of application No. PCT/CN2018/087360, filed on May 17, 2018.
Claims priority of application No. 201710841912.5 (CN), filed on Sep. 18, 2017.
Prior Publication US 2022/0269553 A1, Aug. 25, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 11/00 (2006.01); G06F 11/07 (2006.01)
CPC G06F 11/0772 (2013.01) [G06F 11/073 (2013.01); G06F 11/076 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A memory evaluation method, comprising:
implementing an evaluation model for evaluating a health degree of a memory of a server;
obtaining error information of the memory;
generating the health degree of the memory by analyzing the error information using the evaluation model;
generating health degree indication information corresponding to the health degree, wherein the health degree indication information indicates whether the memory is to be replaced before the memory is faulty; and
displaying, when the memory is not faulty and the health degree of the memory is less than a threshold of a preset health degree range, the health degree indication information as an alarm signal instructing replacement of the memory,
wherein the memory is random-access memory (RAM).