| CPC G01R 31/31725 (2013.01) [G01R 31/31724 (2013.01); H03M 1/1071 (2013.01)] | 18 Claims |
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1. A semiconductor integrated circuit comprising:
a digital-to-analog converter configured to perform a conversion operation to generate an analog output signal by converting a digital input signal corresponding to an external digital signal that is provided from an external device outside the semiconductor integrated circuit and provide the analog output signal to the external device;
an analog-to-digital converter configured to generate a digital output signal by converting the analog output signal; and
a built-in self-test circuit configured to, while the digital-to-analog converter performs the conversion operation, perform a real-time monitoring operation to generate a comparison alarm signal based on the digital input signal and the analog output signal, the comparison alarm signal indicating whether the digital-to-analog converter operates, the built-in self-test circuit including an on-time monitor comprising:
a delay circuit configured to generate a digital delay signal by delaying the digital input signal based on a digital delay amount of the digital-to-analog converter and an analog delay amount of the analog-to-digital converter, and
a comparison circuit configured to generate the comparison alarm signal by comparing the digital output signal and the digital delay signal.
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