US 11,867,755 B2
Memory device test method, apparatus, and system, medium, and electronic device
Yu Yu, Hefei (CN)
Assigned to CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei (CN)
Filed by CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei (CN)
Filed on Jan. 21, 2022, as Appl. No. 17/648,570.
Application 17/648,570 is a continuation of application No. PCT/CN2021/120069, filed on Sep. 24, 2021.
Claims priority of application No. 202110260087.6 (CN), filed on Mar. 10, 2021.
Prior Publication US 2022/0291284 A1, Sep. 15, 2022
Int. Cl. G01R 31/317 (2006.01); G01R 31/3183 (2006.01); G01R 31/319 (2006.01); G01R 31/3193 (2006.01)
CPC G01R 31/31713 (2013.01) [G01R 31/31905 (2013.01); G01R 31/31919 (2013.01); G01R 31/31935 (2013.01); G01R 31/318314 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A memory device test method, comprising:
determining an operation path according to position coordinates of a target test platform and current position coordinates of a memory device;
setting a movable apparatus according to the operation path, such that the movable apparatus moves the memory device into the target test platform according to the operation path, wherein the movable apparatus comprises a mechanical arm and a console, the operation path is sent to the console, and the mechanical arm is controlled through the console, such that the mechanical arm moves the memory device into the target test platform according to the operation path;
controlling the target test platform to test the memory device according to a target test program; and
monitoring a test result of the memory device in real time, and storing the test result of the memory device into a database;
wherein the operation path comprises a target point, the target point is at a preset distance from the target test platform, and when the memory device is moved to the target point, a height sensor detects a target distance between the mechanical arm and the target test platform; and
when the target distance is less than the preset distance, the method further comprises:
configuring a new target test platform;
determining a new operation path according to position coordinates of the new target test platform and the current position coordinates of the memory device, the current position coordinates of the memory device being position coordinates of the target point;
sending the new operation path to the movable apparatus, such that the movable apparatus moves the memory device into the new target test platform according to the new operation path, the new operation path comprising a new target point;
detecting a new target distance between the mechanical arm and the new target test platform through the height sensor when the memory device is moved to the new target point; and
repeating the foregoing steps, until the new target distance is equal to a new preset distance, such that the movable apparatus places the memory device on the new target test platform, and the new target test platform is controlled to test the memory device according to the target test program.