US 11,867,720 B2
Test system configuration adapter systems and methods
Eddy Wayne Chow, San Jose, CA (US)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Nov. 16, 2020, as Appl. No. 17/099,610.
Prior Publication US 2022/0155342 A1, May 19, 2022
Int. Cl. G01R 1/04 (2006.01); G01R 31/319 (2006.01); G01R 31/3185 (2006.01)
CPC G01R 1/0441 (2013.01) [G01R 31/31905 (2013.01); G01R 31/318519 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A test system configuration adapter comprising:
a tester side socket configured to couple with a test equipment socket via a load board;
a break out pin configured to couple with supplemental equipment, the breakout pin is separate from the load board and wherein coupling of the break out pin to the supplemental equipment is separate from the load board coupling to the test equipment socket; and
a device under test side slot configured to couple with the tester side socket, the break out pin, and a device under test;
wherein the test system configuration adapter is configured to enable communication between the device under test and test equipment coupled to the test equipment socket and the supplemental equipment coupled to the breakout pin, wherein coupling of the supplemental system to the device under test is separate from the load board, wherein the device under test remains coupled to the device under test side slot during the communication.