US 11,867,505 B2
Interferometric speckle visibility spectroscopy
Joshua Brake, Pasadena, CA (US); Jian Xu, Redmond, WA (US); and Changhuei Yang, South Pasadena, CA (US)
Assigned to California Institute of Technology, Pasadena, CA (US)
Filed by California Institute of Technology, Pasadena, CA (US)
Filed on Apr. 28, 2022, as Appl. No. 17/661,254.
Application 17/661,254 is a continuation of application No. 16/946,063, filed on Jun. 4, 2020, granted, now 11,346,650.
Claims priority of provisional application 62/856,963, filed on Jun. 4, 2019.
Prior Publication US 2022/0341723 A1, Oct. 27, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01B 9/02055 (2022.01); G01B 11/24 (2006.01); G01B 9/02015 (2022.01)
CPC G01B 9/02082 (2013.01) [G01B 9/02024 (2013.01); G01B 11/2441 (2013.01)] 15 Claims
OG exemplary drawing
 
1. An interferometric speckle visibility spectroscopy system, comprising:
one or more optical systems configured to interfere at least one off-axis reference beam with a sample signal;
one or more sensors configured to record at least one off-axis interferogram over an exposure time; and
one or more processors configured to execute instructions to:
(i) recover speckle field data or a speckle field pattern based at least in part on the at least one off-axis interferogram; and
(ii) determine at least one decorrelation time based at least in part on speckle statistics of the speckle field data or the speckle field pattern.