US 11,867,501 B2
Integrated calibration tool for optical instrument entrance pupil 6-axis spatial allocation
Pengfei Wu, Nanjing (CN); Wei Zhou, Sammamish, WA (US); Jiang He, Nanjing (CN); and Siyuan Liang, Nanjing (CN)
Assigned to MLOptic Corp., Redmond, WA (US)
Filed by MLOptic Corp, Redmond, WA (US)
Filed on Dec. 28, 2021, as Appl. No. 17/563,873.
Prior Publication US 2023/0204351 A1, Jun. 29, 2023
Int. Cl. G01B 11/27 (2006.01)
CPC G01B 11/27 (2013.01) 15 Claims
OG exemplary drawing
 
1. A system for calibrating an equipment, said system comprising:
(a) a beam splitter;
(b) a first reticle configured to be removably attached to the equipment;
(c) an image capture device comprising an image plane, wherein an image of said first reticle is configured to be received by way of said beam splitter at said image plane along an optical axis of said beam splitter; and
(d) a second reticle configured to be removably attached to said beam splitter and an image of said second reticle is configured to be received by way of said beam splitter at said image plane along the optical axis of said beam splitter,
wherein the orientation as indicated by said second reticle is compared to an orientation of the image plane and if the orientation as indicated by said second reticle differs from the orientation of the image plane, at least one of a position and an orientation of the image capture device is adjusted such that the orientation as indicated by said second reticle matches the orientation of the image plane and the orientation as indicated by said first reticle is compared to the orientation of the image plane and if the orientation as indicated by said first reticle differs from the orientation of the image plane, the equipment is rotated about said optical axis of said beam splitter such that the orientation as indicated by said first reticle matches the orientation of the image plane.