US 11,865,770 B2
Method for calibrating an irradiation device
Tim Klaußner, Kronach (DE); Christian Dicken, Weidenberg (DE); and Bertram Gärber, Neustadt (DE)
Assigned to CONCEPT LASER GMBH, Lichtenfels (DE)
Filed by CONCEPT LASER GMBH, Lichtenfels (DE)
Filed on Mar. 4, 2019, as Appl. No. 16/291,666.
Claims priority of application No. 18195570 (EP), filed on Sep. 19, 2018.
Prior Publication US 2020/0086557 A1, Mar. 19, 2020
Int. Cl. B29C 64/153 (2017.01); B29C 64/135 (2017.01); B23K 26/04 (2014.01); B23K 26/32 (2014.01)
CPC B29C 64/153 (2017.08) [B23K 26/04 (2013.01); B23K 26/32 (2013.01); B29C 64/135 (2017.08)] 20 Claims
OG exemplary drawing
 
1. A method of calibrating an irradiation device of an apparatus for additively manufacturing three-dimensional objects, the method comprising:
generating a first calibration pattern on a first determination region of a build plane, the first calibration pattern generated with a first energy beam emitted by a first irradiation unit of the irradiation device;
generating a second calibration pattern on a second determination region of the build plane, the second calibration pattern generated with a second energy beam emitted by a second irradiation unit of the irradiation device;
collecting, via an optical sensor, a first image of the first calibration pattern on at least one part of the first determination region of the build plane and a second image of the second calibration pattern on at least one part of the second determination region of the build plane, the first image generated by a second on-axis determination unit of the second irradiation unit, the second image generated by a first on-axis determination unit of the first irradiation unit, wherein at least one reflected part of the first energy beam emitted from the build plane is guided via a first beam guiding unit to a determination element of the first on-axis determination unit;
determining calibration information comprising a first position of the first calibration pattern within the first determination region on the basis of the first image, and a second position of the second calibration pattern within the second determination region on the basis of the second image; and
determining a calibration status of at least one of the first irradiation unit and the second irradiation unit, the calibration status determined based at least in part on the calibration information.