CPC H04N 25/78 (2023.01) [H04N 25/771 (2023.01); H04N 25/79 (2023.01)] | 20 Claims |
1. A CMOS image sensor, comprising:
a plurality of image sensor units, each of the plurality of image sensor units comprising a pixel unit and a resistive random access memory unit (RRAM unit) connected to the pixel unit, the pixel unit configured to convert a received optical signal into an analog electrical signal and output the analog electrical signal, and the RRAM unit configured to convert the analog electrical signal into a resistance value; and
a resistance-to-digital converting (RDC) unit, connected to the plurality of the image sensor units and configured to convert the resistance value into a digital signal; wherein the RDC unit comprises a resistance-to-voltage converting (RDC) module configured to convert the resistance value into a voltage value and an analog-to-digital converting module configured to convert the voltage value into a digital signal.
|