US 11,862,451 B2
Orthogonal acceleration time-of-flight mass spectrometer
Takuya Suzumura, Kyoto (JP); Daisuke Okumura, Kyoto (JP); and Tomoya Kudo, Kyoto (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP)
Filed by SHIMADZU CORPORATION, Kyoto (JP)
Filed on May 10, 2022, as Appl. No. 17/740,991.
Claims priority of application No. 2021-121007 (JP), filed on Jul. 21, 2021.
Prior Publication US 2023/0022148 A1, Jan. 26, 2023
Int. Cl. H01J 49/40 (2006.01)
CPC H01J 49/401 (2013.01) [H01J 49/403 (2013.01); H01J 49/405 (2013.01)] 4 Claims
OG exemplary drawing
 
1. An orthogonal acceleration time-of-flight mass spectrometer, comprising:
an ion ejector configured to eject measurement-target ions in a predetermined direction;
an orthogonal accelerator configured to accelerate ions in a direction orthogonal to the direction in which the ions are ejected;
a ring electrode located between the ion ejector and the orthogonal accelerator, the ring electrode having an opening for allowing ions to pass through and arranged so that a central axis of the opening is shifted from a central axis of the ion ejector in a direction along an axis of acceleration of the ions by the orthogonal accelerator;
a reflectron electrode configured to create a repelling electric field for reversing a direction of the ions accelerated by the orthogonal accelerator; and
an ion detector configured to detect ions after the direction of flight of the ions is reversed by the reflectron electrode.