CPC G11C 29/50004 (2013.01) [G11C 2029/5004 (2013.01); G11C 2029/5006 (2013.01)] | 20 Claims |
1. A deterioration detection device comprising:
a storage including a first current path and a second current path to which a current is selectively applied;
a storage input control circuit configured to compare an internal operating condition of a memory device with a target condition in a first operating mode and to selectively apply the current to one of the first current path and the second current path of the storage based on a result of the comparison; and
an output circuit configured to output an output signal indicating deterioration, accumulated in one of the first current path and the second current path, in a second operating mode,
wherein the internal operating condition of the memory device includes an internal temperature of the memory device.
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