US 11,862,277 B2
Deterioration detection device
Youngduk Lee, Asan-si (KR); and Hyunsung Lim, Asan-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on May 21, 2022, as Appl. No. 17/750,317.
Claims priority of application No. 10-2021-0117792 (KR), filed on Sep. 3, 2021.
Prior Publication US 2023/0071135 A1, Mar. 9, 2023
Int. Cl. G11C 29/50 (2006.01)
CPC G11C 29/50004 (2013.01) [G11C 2029/5004 (2013.01); G11C 2029/5006 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A deterioration detection device comprising:
a storage including a first current path and a second current path to which a current is selectively applied;
a storage input control circuit configured to compare an internal operating condition of a memory device with a target condition in a first operating mode and to selectively apply the current to one of the first current path and the second current path of the storage based on a result of the comparison; and
an output circuit configured to output an output signal indicating deterioration, accumulated in one of the first current path and the second current path, in a second operating mode,
wherein the internal operating condition of the memory device includes an internal temperature of the memory device.