CPC G11C 29/10 (2013.01) [G11C 29/36 (2013.01); G11C 29/56 (2013.01); G11C 29/56004 (2013.01); G11C 2029/4002 (2013.01)] | 20 Claims |
1. A test method for a control chip, comprising:
reading, by automatic test equipment (ATE), first test vectors stored in a first target memory chip;
sending, by the ATE, the first test vectors to the control chip;
receiving, by the ATE, first output information returned by the control chip in response to the first test vectors; and
acquiring, by the ATE, a first test result of the control chip based on the first output information and the first test vectors corresponding to the first output information.
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