US 11,861,286 B2
Segregating defects based on computer-aided design (CAD) identifiers associated with the defects
Ankush B. Oberai, Fremont, CA (US); and Kiran U. Agashe, Mumbai (IN)
Assigned to Synopsys, Inc., Sunnyvale, CA (US)
Filed by Synopsys, Inc., Mountain View, CA (US)
Filed on Jun. 29, 2021, as Appl. No. 17/362,085.
Claims priority of provisional application 63/046,425, filed on Jun. 30, 2020.
Prior Publication US 2021/0406441 A1, Dec. 30, 2021
Int. Cl. G06F 30/398 (2020.01); G06F 30/27 (2020.01); G06F 30/394 (2020.01); G06F 30/392 (2020.01); G06F 119/02 (2020.01)
CPC G06F 30/398 (2020.01) [G06F 30/27 (2020.01); G06F 30/392 (2020.01); G06F 30/394 (2020.01); G06F 2119/02 (2020.01)] 18 Claims
OG exemplary drawing
 
1. A method, comprising:
for each defect in a set of defects, associating the defect with a defect attribute constructed from a set of computer-aided design (CAD) identifiers associated with polygons in an integrated circuit (IC) design that overlap with a defect area of the defect;
segregating, by a processor, the set of defects into defect groups based on the associated defect attributes, wherein segregating the set of defects into defect groups based on the associated defect attributes comprises using a machine learning (ML) clustering technique; and
using the defect groups to perform additional processing on the set of defects, wherein the additional processing comprises analyzing defects in a given defect group to identify a root cause for the defects in the given defect group.