US 11,861,233 B2
Using duplicate data for improving error correction capability
Jeffrey S. McNeil, Nampa, ID (US); Kishore Kumar Muchherla, Fremont, CA (US); Sivagnanam Parthasarathy, Carlsbad, CA (US); Patrick R. Khayat, San Diego, CA (US); Sundararajan Sankaranarayanan, Fremont, CA (US); Jeremy Binfet, Boise, ID (US); and Akira Goda, Setagaya (JP)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Mar. 10, 2022, as Appl. No. 17/691,467.
Claims priority of provisional application 63/292,830, filed on Dec. 22, 2021.
Prior Publication US 2023/0195385 A1, Jun. 22, 2023
Int. Cl. G06F 12/00 (2006.01); G06F 3/06 (2006.01); G11C 16/26 (2006.01); G11C 16/04 (2006.01)
CPC G06F 3/0659 (2013.01) [G06F 3/0619 (2013.01); G06F 3/0673 (2013.01); G11C 16/26 (2013.01); G11C 16/0483 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device; and
a processing device, operatively coupled with the memory device, to perform operations comprising:
receiving data to be stored on the memory device;
storing a first copy of the data in a first set of memory cells of the memory device, wherein the first set of memory cells comprises a first memory cell;
storing a second copy of the data in a second set of memory cells of the memory device, wherein the second set of memory cells comprises a second memory cell;
reading the first copy of the data and determining whether a threshold voltage of the first memory cell is within a first overlapping range of a first threshold voltage distribution and a second threshold voltage distribution, wherein each distribution is representative of a respective binary logical state of the first memory cell;
responsive to determining that the threshold voltage of the first memory cell is within the first overlapping range, reading the second copy of the data and determining whether the threshold voltage of the second memory cell is within a second overlapping range of a third threshold voltage distribution and a fourth threshold voltage distribution, wherein each distribution is representative of a respective binary logical state of the second memory cell; and
responsive to determining that the threshold voltage of the second memory cell is outside the second overlapping range, using the second copy of the data.