US 11,860,734 B2
Semiconductor memory devices and memory systems
Sungrae Kim, Hwaseong-si (KR); Sunghye Cho, Hwaseong-si (KR); Yeonggeol Song, Seoul (KR); Kijun Lee, Seoul (KR); and Myungkyu Lee, Seoul (KR)
Assigned to Samsung Electronics Co., Ltd.
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on May 4, 2022, as Appl. No. 17/736,154.
Application 17/736,154 is a continuation of application No. PCT/CN2021/100853, filed on Jun. 18, 2021.
Claims priority of application No. 10-2021-0139195 (KR), filed on Oct. 19, 2021.
Prior Publication US 2023/0119555 A1, Apr. 20, 2023
Int. Cl. G11C 29/00 (2006.01); G06F 11/10 (2006.01); H03M 13/11 (2006.01); G06F 11/07 (2006.01)
CPC G06F 11/1068 (2013.01) [G06F 11/0772 (2013.01); G06F 11/1048 (2013.01); H03M 13/1108 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A semiconductor memory device comprising:
a memory cell array;
an on-die error correction code (ECC) engine, based on an ECC, configured to, in a write operation:
perform an ECC encoding operation on main data received from a memory controller to generate first parity data;
selectively replace a portion of the first parity data with a poison flag to generate second parity data based on a poison mode signal, wherein the poison mode signal designates a normal mode or a poison mode;
output the second parity data and the poison flag;
provide the main data to a normal cell region in a target page of the memory cell array; and
provide the first parity data to a parity cell region in the target page in the normal mode or provide the poison flag and the second parity data to the parity cell region in the poison mode; and
a control logic circuit configured to control the on-die ECC engine and to generate the poison mode signal based on a command and an address from the memory controller.