US 11,860,354 B2
Imaging system
Zhiguang Xu, Malvern, PA (US); and Alfredo Andres Celedon, Columbia, MD (US)
Assigned to Scanogen Inc., Baltimore, MD (US)
Filed by SCANOGEN INC., Baltimore, MD (US)
Filed on May 12, 2022, as Appl. No. 17/743,166.
Application 17/743,166 is a continuation of application No. 17/013,343, filed on Sep. 4, 2020, granted, now 11,360,296.
Application 17/013,343 is a continuation of application No. 15/444,462, filed on Feb. 28, 2017, granted, now 10,768,406, issued on Sep. 8, 2020.
Claims priority of provisional application 62/352,222, filed on Jun. 20, 2016.
Prior Publication US 2022/0276480 A1, Sep. 1, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G02B 21/36 (2006.01); G02B 21/06 (2006.01); G01B 9/04 (2006.01); G02B 21/16 (2006.01)
CPC G02B 21/361 (2013.01) [G01B 9/04 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/365 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An imaging system, comprising:
an illumination source configured to illuminate a sample including a target analyte, wherein the target analyte forms a target-probe complex that binds to a particle on a first end and to a substrate on another end;
a lens configured to generate a blurred image of the particle, wherein a dimension of the blurred image of the particle is greater than a dimension of the particle multiplied by the magnification of the lens, and wherein a field of view in an image plane of the lens is larger than twice a size of the particle;
an image sensor having a pixel size of less than about the dimension of the blurred image of the particle, the image sensor configured to sense the blurred image of the particle, wherein an intensity of the blurred image of the particle is distributed on at least two pixels to form an intensity distribution; and
an image processor coupled with the image sensor and configured to determine a center of the intensity distribution associated with a first position of the particle, wherein the image processor is further configured to determine a displacement from the first position of the particle to a second position of the particle in a second configuration of the sample, the displacement being indicative of a binding of the particle to the target-probe complex.