US 11,860,221 B2
Apparatus for testing electronic devices
Donald P. Richmond, II, Palo Alto, CA (US); Kenneth W. Deboe, Santa Clara, CA (US); Frank O. Uher, Los Altos, CA (US); Jovan Jovanovic, Santa Clara, CA (US); Scott E. Lindsey, Brentwood, CA (US); Thomas T. Maenner, San Ramon, CA (US); Patrick M. Shepherd, San Jose, CA (US); Jeffrey L. Tyson, Mountain View, CA (US); Mark C. Carbone, Cupertino, CA (US); Paul W. Burke, Hayward, CA (US); Doan D. Cao, San Jose, CA (US); James F. Tomic, Oakland, CA (US); and Long V. Vu, San Jose, CA (US)
Assigned to AEHR TEST SYSTEMS, Fremont, CA (US)
Filed by AEHR TEST SYSTEMS, Fremont, CA (US)
Filed on Jan. 12, 2022, as Appl. No. 17/574,300.
Application 17/036,839 is a division of application No. 16/121,192, filed on Sep. 4, 2018, granted, now 10,852,347, issued on Dec. 1, 2020.
Application 16/121,192 is a division of application No. 15/060,443, filed on Mar. 3, 2016, granted, now 10,094,872, issued on Oct. 9, 2018.
Application 15/060,443 is a division of application No. 14/833,938, filed on Aug. 24, 2015, granted, now 9,316,683, issued on Apr. 19, 2016.
Application 14/833,938 is a division of application No. 14/263,826, filed on Apr. 28, 2014, granted, now 9,151,797, issued on Oct. 6, 2015.
Application 14/263,826 is a division of application No. 14/097,541, filed on Dec. 5, 2013, granted, now 8,747,123, issued on Jun. 10, 2014.
Application 14/097,541 is a division of application No. 13/939,364, filed on Jul. 11, 2013, granted, now 8,628,336, issued on Jan. 14, 2014.
Application 13/939,364 is a division of application No. 13/754,765, filed on Jan. 30, 2013, granted, now 8,506,335, issued on Aug. 13, 2013.
Application 13/754,765 is a division of application No. 13/353,269, filed on Jan. 18, 2012, granted, now 8,388,357, issued on Mar. 5, 2013.
Application 13/353,269 is a division of application No. 12/772,932, filed on May 3, 2010, granted, now 8,118,618, issued on Feb. 21, 2012.
Application 12/772,932 is a division of application No. 11/413,323, filed on Apr. 27, 2006, granted, now 7,762,822, issued on Jul. 27, 2010.
Application 17/574,300 is a continuation of application No. 17/036,839, filed on Sep. 29, 2020, granted, now 11,255,903.
Claims priority of provisional application 60/687,502, filed on Jun. 3, 2005.
Claims priority of provisional application 60/682,989, filed on May 19, 2005.
Claims priority of provisional application 60/675,546, filed on Apr. 27, 2005.
Prior Publication US 2022/0137121 A1, May 5, 2022
Int. Cl. G01R 31/28 (2006.01); G01R 31/26 (2020.01); G01R 31/00 (2006.01); G06F 8/30 (2018.01); G01R 31/319 (2006.01)
CPC G01R 31/287 (2013.01) [G01R 31/003 (2013.01); G01R 31/26 (2013.01); G01R 31/2642 (2013.01); G01R 31/2851 (2013.01); G01R 31/2863 (2013.01); G01R 31/2868 (2013.01); G01R 31/2872 (2013.01); G01R 31/2877 (2013.01); G01R 31/2886 (2013.01); G01R 31/2889 (2013.01); G01R 31/2891 (2013.01); G06F 8/30 (2013.01); G01R 31/2855 (2013.01); G01R 31/31924 (2013.01)] 12 Claims
OG exemplary drawing
 
1. An apparatus for testing integrated circuits of devices, comprising:
at least one frame;
a holder for a device, secured to the frame;
a contactor support structure held by the frame;
a plurality of terminals, held by the contactor support structure, for contacting respective contacts of a device;
at least first and second interfaces, on the contactor support structure, each having at least one row of contacts for contacting a respective terminal of a connector, the rows of the contacts of the interfaces being at an angle between 0° and 180° relative to one another; and
a plurality of conductors, held by the contactor support structure, connecting the contacts of the interfaces and the terminals on the contactor support structure to one another, the holder and contactor support structure being movable relative to one another so that each one of the terminals releasably makes contact with a respective contact of the device;
a power source;
a power electrical path connecting the power source to a power terminal of the terminals held by the support structure;
a signal source; and
a plurality of signal electrical paths, each connecting the signal source to a respective signal terminal of the terminals held by the support structure.