US 11,860,112 B2
Inspection system and inspection method
Naoya Nakayama, Tokyo (JP); Masanori Sekido, Tokyo (JP); Shinichi Morimoto, Tokyo (JP); Masayuki Ariyoshi, Tokyo (JP); Tatsuya Sumiya, Tokyo (JP); Toshiyuki Nomura, Tokyo (JP); and Toshinori Takemura, Tokyo (JP)
Assigned to NEC CORPORATION, Tokyo (JP)
Filed by NEC Corporation, Tokyo (JP)
Filed on Mar. 11, 2022, as Appl. No. 17/692,359.
Claims priority of application No. 2021-045901 (JP), filed on Mar. 19, 2021.
Prior Publication US 2022/0299454 A1, Sep. 22, 2022
Int. Cl. G01N 23/04 (2018.01); G01N 23/10 (2018.01); G01N 23/18 (2018.01); G01V 5/00 (2006.01)
CPC G01N 23/10 (2013.01) [G01N 23/04 (2013.01); G01N 23/18 (2013.01); G01V 5/0016 (2013.01); G01N 2223/03 (2013.01); G01N 2223/052 (2013.01); G01N 2223/101 (2013.01)] 9 Claims
OG exemplary drawing
 
1. An inspection system, comprising:
at least one memory configured to store one or more instructions; and
at least one processor configured to execute the one or more instructions to:
control irradiation of an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and control receiving a reflection wave;
perform a first inspection to detect preset detection target objects, based on a signal of the reflection wave;
select a path leading to a secondary inspection for a first inspection target person from which a first detection target object is detected, the first detection target object being included in the preset detection target objects; and
select a path not leading to the secondary inspection for a second inspection target person from which the first detection target object is not detected and a second detection target object is detected, and register identification information of the second inspection target person in association with a result of the first inspection, the second detection target object being included in the preset detection target objects.