US 11,860,093 B2
Multi-wavelength laser inspection
Keith D. Humfeld, Federal Way, WA (US); and Morteza Safai, Newcastle, WA (US)
Assigned to The Boeing Company, Arlington, VA (US)
Filed by The Boeing Company, Chicago, IL (US)
Filed on Feb. 25, 2022, as Appl. No. 17/681,650.
Application 16/890,950 is a division of application No. 15/991,292, filed on May 29, 2018, granted, now 10,705,019, issued on Jul. 7, 2020.
Application 17/681,650 is a continuation of application No. 16/890,950, filed on Jun. 2, 2020, granted, now 11,262,302.
Prior Publication US 2022/0178823 A1, Jun. 9, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01N 21/64 (2006.01); G01J 3/44 (2006.01); G01J 3/02 (2006.01); H01S 5/10 (2021.01); G01J 3/06 (2006.01); G01J 3/28 (2006.01)
CPC G01N 21/6402 (2013.01) [G01J 3/0232 (2013.01); G01J 3/4406 (2013.01); G01J 3/2889 (2013.01); G01J 2003/064 (2013.01); G01N 2021/6419 (2013.01); G01N 2021/6421 (2013.01); H01S 5/1092 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system for inspecting a surface, comprising:
an optical system including at least one optical element, the optical system configured to:
direct a first pulse of light having a first wavelength to a first point along a scan line and a second pulse of light having a second wavelength to a second point along the scan line during a first time period, and
direct a third pulse of light having the first wavelength to the second point and a fourth pulse of light having the second wavelength to the first point during a second time period; and
a gated camera configured to:
record a first fluorescent response of the surface to the first pulse of light and a second fluorescent response of the surface to the second pulse of light, and
record a third fluorescent response of the surface to the third pulse of light and a fourth fluorescent response of the surface to the fourth pulse of light.