CPC G01N 21/3586 (2013.01) [G01N 21/41 (2013.01)] | 20 Claims |
1. An apparatus for dynamic characterization of a sample of a material under test comprising:
a terahertz (THz) time-domain spectroscopy system configured and arranged to generate and detect terahertz waves to interrogate the sample;
a shock wave loading system configured and arranged to produce a shock wave in the sample;
wherein the sample undergoes changes in an index of refraction in response to the produced shock wave in the sample that are detected by the terahertz time-domain spectroscopy system during the interrogating; and
a non-contact interferometer positioned with respect to the sample to further detect free-surface displacement in the sample.
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