US 11,860,088 B2
Apparatus and method for dynamic characterization of materials
George Youssef, Solana Beach, CA (US); and Nha Uyen Huynh, La Jolla, CA (US)
Assigned to SAN DIEGO STATE UNIVERSITY (SDSU) FOUNDATION, San Diego, CA (US)
Appl. No. 17/770,277
Filed by San Diego State University (SDSU) Foundation, San Diego, CA (US)
PCT Filed Oct. 30, 2020, PCT No. PCT/US2020/058391
§ 371(c)(1), (2) Date Apr. 19, 2022,
PCT Pub. No. WO2021/087383, PCT Pub. Date May 6, 2021.
Claims priority of provisional application 62/929,586, filed on Nov. 1, 2019.
Prior Publication US 2022/0373458 A1, Nov. 24, 2022
Int. Cl. G01N 21/3586 (2014.01); G01N 21/41 (2006.01)
CPC G01N 21/3586 (2013.01) [G01N 21/41 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus for dynamic characterization of a sample of a material under test comprising:
a terahertz (THz) time-domain spectroscopy system configured and arranged to generate and detect terahertz waves to interrogate the sample;
a shock wave loading system configured and arranged to produce a shock wave in the sample;
wherein the sample undergoes changes in an index of refraction in response to the produced shock wave in the sample that are detected by the terahertz time-domain spectroscopy system during the interrogating; and
a non-contact interferometer positioned with respect to the sample to further detect free-surface displacement in the sample.