US 11,859,977 B2
Surveying device, surveying method, and surveying program
You Sasaki, Tokyo (JP)
Assigned to TOPCON CORPORATION, Tokyo (JP)
Filed by TOPCON CORPORATION, Tokyo (JP)
Filed on Mar. 14, 2023, as Appl. No. 18/183,183.
Claims priority of application No. 2022-043526 (JP), filed on Mar. 18, 2022.
Prior Publication US 2023/0296378 A1, Sep. 21, 2023
Int. Cl. G01C 15/00 (2006.01); G01S 3/786 (2006.01); G01C 15/12 (2006.01); G01C 1/00 (2006.01)
CPC G01C 15/006 (2013.01) [G01C 1/00 (2013.01); G01C 15/12 (2013.01); G01S 3/7861 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A surveying device comprising a processor or circuitry configured to:
measure an incident direction of sunlight that enters a laser scanning apparatus, based on a detected waveform of incident light entering the laser scanning apparatus;
acquire a direction of the Sun as seen from the laser scanning apparatus, from astronomical data, based on a position of the laser scanning apparatus; and
calculate an attitude of the laser scanning apparatus in an absolute coordinate system, based on the incident direction of sunlight and the direction of the Sun as seen from the laser scanning apparatus, which is acquired from the astronomical data.