US 11,859,962 B2
Method for examining a coating of a probe surface
Rolf Doering, Münster (DE); Torsten Engelmann, Münster (DE); Michael Freitag, Münster (DE); Susanne Behrens, Münster (DE); Peter Stockbrink, Münster (DE); Nils Tegethoff, Münster (DE); Karin Eckert, Münster (DE); and Jutta Kersting, Münster (DE)
Assigned to BASF COATINGS GMBH, Muenster (DE)
Appl. No. 17/603,159
Filed by BASF Coatings GmbH, Münster (DE)
PCT Filed Apr. 9, 2020, PCT No. PCT/EP2020/060244
§ 371(c)(1), (2) Date Oct. 12, 2021,
PCT Pub. No. WO2020/208180, PCT Pub. Date Oct. 15, 2020.
Claims priority of application No. 19169102 (EP), filed on Apr. 12, 2019.
Prior Publication US 2022/0196389 A1, Jun. 23, 2022
Int. Cl. G01B 11/06 (2006.01); G01B 9/02 (2022.01); G01B 11/24 (2006.01)
CPC G01B 11/0675 (2013.01) [G01B 9/02047 (2013.01); G01B 11/2441 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A computer-implemented method for examining a coating of a probe surface, the method comprising using an examining device comprising a processor in communication with a memory to perform the steps of
receiving sensing data indicative of a depth of the coating at each of a predetermined subset of probe surface points,
determining a depth representation of the coating from the received sensing data, wherein the determined depth representation comprises a topographic map of the coating of the probe surface, and
deriving a coating property based on the topographic map, wherein deriving the coating property based on the topographic map comprises:
generating a depth histogram (H) by:
a) counting, for each of a plurality of predetermined depth intervals, a number of the probe surface points in the subset for which the coating depth indicated by the topographic map lies in the respective depth interval, and
b) associating the counting results with the respective depth interval.